ESPRIT '88: Putting the Technology to Use : Proceedings of the 5th Annual ESPRIT Conference, Brussels, November 14-17, 1988, Part 1North-Holland, 1988 - 1759 pages Part1. Advanced microelectronics. VLSI technologies - comparisons and prospects. Software technology. Advanced information processing. Part2. Office systems.Computer integrated manufacturing. Information exchange system. |
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Page 453
95 l WRITING TOOLS FOR PCTE AND PACT: THE HOW-TO-DOIT GUIDE Ian
Thomas Bull Research Centre, 68 route de Versailles, 78430 Louveciennes,
FRANCE. ABSTRACT This paper presents a brief review of how to write tools for
PCTE ...
95 l WRITING TOOLS FOR PCTE AND PACT: THE HOW-TO-DOIT GUIDE Ian
Thomas Bull Research Centre, 68 route de Versailles, 78430 Louveciennes,
FRANCE. ABSTRACT This paper presents a brief review of how to write tools for
PCTE ...
Page 522
Debug and Test Architecture The Aphrodite debugging and testing tools are
located in the PCTE environment” where they can take advantage of all PCTE
facilities (and in particular the PCTE Object Management System) with the proper
...
Debug and Test Architecture The Aphrodite debugging and testing tools are
located in the PCTE environment” where they can take advantage of all PCTE
facilities (and in particular the PCTE Object Management System) with the proper
...
Page 528
As a result of this analysis, the following components have been identified: -
PCTE user processes; - code executed in supervisor mode; - Emeraude and
CHORUS System actors. 4.2.1 PCTE user processes A PCTE process is
accessing a ...
As a result of this analysis, the following components have been identified: -
PCTE user processes; - code executed in supervisor mode; - Emeraude and
CHORUS System actors. 4.2.1 PCTE user processes A PCTE process is
accessing a ...
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Contents
Technology Transfer from Research to Development Project 97 Pype P Van Meerbergen J De Man | 5 |
Materials and Devices Toward ThreeDimensional Integration Project 245 Cahill C G Dunne B OFlanagan S Hobbs L Mathewson A | 21 |
Physical ºquivalentCircuit Models for GaAs Mesſets Project 255 Ghione G Naldi C Pettenpaul E Ponse F | 52 |
Copyright | |
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Common terms and phrases
abstract abstract machine algorithm allows analysis Aphrodite application approach architecture Artificial Intelligence basic behaviour BFNEW BICMOS cell chip circuit CMOS complex components Computer concepts constraints DAIDA database defined definition described devices distributed domain dynamic environment error Esprit Project etch evaluation example execution expert systems Figure function GaAs gate global goal graphical GRASPIN IEEE implementation information system input integrated interaction interpreter knowledge base knowledge representation language layer LFSR logic programming machine mapping MESFET metaclass method methodology migration module node object-oriented objects operations output parallel parameters partial evaluation PCTE performance phase PIMS possible predicates problem procedure processor programming language project management Prolog Prolog III prototype query representation requirements rules semantic signal simulation specification structure subcircuit task techniques transistor transputer UNIX user interface VLSI wafer