ESPRIT '88: Putting the Technology to Use : Proceedings of the 5th Annual ESPRIT Conference, Brussels, November 14-17, 1988, Part 1North-Holland, 1988 - 1759 pages Part1. Advanced microelectronics. VLSI technologies - comparisons and prospects. Software technology. Advanced information processing. Part2. Office systems.Computer integrated manufacturing. Information exchange system. |
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Page 89
... chip the statistical interpretation of yield data is more difficult for semicustom chips . In general one has to consider a whole family of circuits , the members of which show a great variety of applications and complexities . The ...
... chip the statistical interpretation of yield data is more difficult for semicustom chips . In general one has to consider a whole family of circuits , the members of which show a great variety of applications and complexities . The ...
Page 91
... chip yield is the multiple chip analysis [ 2 ] . Several neighbouring chips on a wafer are grouped together to constitute a " multichip " the size of which is a multiple of the original chip size . A multichip is considered defect ...
... chip yield is the multiple chip analysis [ 2 ] . Several neighbouring chips on a wafer are grouped together to constitute a " multichip " the size of which is a multiple of the original chip size . A multichip is considered defect ...
Page 202
... chip architecture , rather than a collection of test techniques each of which may be optimal for one particular type of logic structure but which do not provide a coherent overall chip test methodology . This paper describes a group of ...
... chip architecture , rather than a collection of test techniques each of which may be optimal for one particular type of logic structure but which do not provide a coherent overall chip test methodology . This paper describes a group of ...
Contents
A Technology Transfer from Research to Development Project | 3 |
BitRate Reduction of High Quality Audio Signals Using FloatingPoint | 13 |
Materials and Devices Toward ThreeDimensional Integration Project 245 | 22 |
Copyright | |
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Common terms and phrases
abstract algorithm allows analysis Aphrodite application approach architecture array basic behaviour BICMOS cell chip circuit CMOS communication complex components Computer concepts constraints database debugging defined demonstrator described devices distributed domain dynamic efficient environment error Esprit Project etching evaluation example execution expert systems Figure function GaAs gate GEODE global goal graphical IEEE implementation inference engine input integrated integrated circuits interaction interpreter kernel knowledge base knowledge representation layer LFSR logic programming machine mechanism memory MESFET method methodology module node object-oriented objects operations optimization output parallel parameters partial evaluation PCTE performance phase possible predicates problem Proc procedure processor Prolog Prolog III prototype query relations representation requirements rule semantic sequence signal simulation specific structure subcircuit SUPERNODE task techniques transistor transputer tuple UNIX VLSI wafer