ESPRIT '88: Putting the Technology to Use : Proceedings of the 5th Annual ESPRIT Conference, Brussels, November 14-17, 1988, Part 1North-Holland, 1988 - 1759 pages Part1. Advanced microelectronics. VLSI technologies - comparisons and prospects. Software technology. Advanced information processing. Part2. Office systems.Computer integrated manufacturing. Information exchange system. |
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Page 89
Third compared with the yield analysis of a fullcustom chip the statistical
interpretation of yield data is more difficult for semicustom chips. In general One
has to consider a whole family of circuits, the members of which show a great
variety of ...
Third compared with the yield analysis of a fullcustom chip the statistical
interpretation of yield data is more difficult for semicustom chips. In general One
has to consider a whole family of circuits, the members of which show a great
variety of ...
Page 91
Multiplied with the corresponding metal pitch one gets an estimate of the critical
area on the chip that is sensitive to defects causing shorts in the first metal layer.
The crosses indicate the results obtained by a computer aided inspection of the ...
Multiplied with the corresponding metal pitch one gets an estimate of the critical
area on the chip that is sensitive to defects causing shorts in the first metal layer.
The crosses indicate the results obtained by a computer aided inspection of the ...
Page 202
This paper describes a group of test styles which are applicable across a wide
range of logic structures and which can be readily combined to give an efficient
overall chip test methodology. The work described here has been undertaken as
...
This paper describes a group of test styles which are applicable across a wide
range of logic structures and which can be readily combined to give an efficient
overall chip test methodology. The work described here has been undertaken as
...
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Contents
Technology Transfer from Research to Development Project 97 Pype P Van Meerbergen J De Man | 5 |
Materials and Devices Toward ThreeDimensional Integration Project 245 Cahill C G Dunne B OFlanagan S Hobbs L Mathewson A | 21 |
Physical ºquivalentCircuit Models for GaAs Mesſets Project 255 Ghione G Naldi C Pettenpaul E Ponse F | 52 |
Copyright | |
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Common terms and phrases
abstract abstract machine algorithm allows analysis Aphrodite application approach architecture Artificial Intelligence basic behaviour BFNEW BICMOS cell chip circuit CMOS complex components Computer concepts constraints DAIDA database defined definition described devices distributed domain dynamic environment error Esprit Project etch evaluation example execution expert systems Figure function GaAs gate global goal graphical GRASPIN IEEE implementation information system input integrated interaction interpreter knowledge base knowledge representation language layer LFSR logic programming machine mapping MESFET metaclass method methodology migration module node object-oriented objects operations output parallel parameters partial evaluation PCTE performance phase PIMS possible predicates problem procedure processor programming language project management Prolog Prolog III prototype query representation requirements rules semantic signal simulation specification structure subcircuit task techniques transistor transputer UNIX user interface VLSI wafer
Bibliographic information
| Title | ESPRIT '88: Putting the Technology to Use : Proceedings of the 5th Annual ESPRIT Conference, Brussels, November 14-17, 1988, Part 1 Volume 5 of ESPRIT : annual conference : proceedings ESPRIT '88: Putting the Technology to Use : Proceedings of the 5th Annual ESPRIT Conference, Brussels, November 14-17, 1988, Commission of the European Communities. Directorate-General for Telecommunications, Information Industries, and Innovation Volume 11852 of EUR (Brussels), ISSN 0303-755X Volume 11852 of EUR (Series) Publication no. EUR 11852 of the Commission of the European Communities, Directorate-General Telecommunications, Information Industries, and Innovation, Luxembourg |
| Author | Commission of the European Communities. Directorate-General for Telecommunications, Information Industries, and Innovation |
| Publisher | North-Holland, 1988 |
| Original from | the University of California |
| Digitized | 6 Nov 2009 |
| ISBN | 0444871454, 9780444871459 |
| Length | 1759 pages |
| Export Citation | BiBTeX EndNote RefMan |