ESPRIT '88: Putting the Technology to Use : Proceedings of the 5th Annual ESPRIT Conference, Brussels, November 14-17, 1988, Part 1North-Holland, 1988 - 1759 pages Part1. Advanced microelectronics. VLSI technologies - comparisons and prospects. Software technology. Advanced information processing. Part2. Office systems.Computer integrated manufacturing. Information exchange system. |
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Page 89
Third compared with the yield analysis of a fullcustom chip the statistical
interpretation of yield data is more difficult for semicustom chips . In general one
has to consider a whole family of circuits , the members of which show a great
variety of ...
Third compared with the yield analysis of a fullcustom chip the statistical
interpretation of yield data is more difficult for semicustom chips . In general one
has to consider a whole family of circuits , the members of which show a great
variety of ...
Page 91
Multiplied with the corresponding metal pitch one gets an estimate of the critical
area on the chip that is sensitive to defects causing shorts in the first metal layer .
The crosses indicate the results obtained by a computer aided inspection of the ...
Multiplied with the corresponding metal pitch one gets an estimate of the critical
area on the chip that is sensitive to defects causing shorts in the first metal layer .
The crosses indicate the results obtained by a computer aided inspection of the ...
Page 202
An efficient implementation of built - in self - test ( BIST ) for parameterised cell -
based semi - custom VLSI design requires a test me thodology which is
optimised in terms of general chip architecture , rather than a collection of test
techniques ...
An efficient implementation of built - in self - test ( BIST ) for parameterised cell -
based semi - custom VLSI design requires a test me thodology which is
optimised in terms of general chip architecture , rather than a collection of test
techniques ...
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Contents
A Technology Transfer from Research to Development Project | 3 |
BitRate Reduction of High Quality Audio Signals Using FloatingPoint | 13 |
Materials and Devices Toward ThreeDimensional Integration Project 245 | 22 |
Copyright | |
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Common terms and phrases
achieved active algorithm allows analysis application approach architecture basic block called cell chip circuit CMOS combination communication complex components concepts connected considered consists constraints contains defined definition demonstrator described devices direction distributed efficient environment error ESPRIT etch evaluation example execution Figure function gate given goal implementation important input integrated interface interpreter knowledge language layer logic machine material means measurements memory metal method module node objects obtained operator output parallel pattern PCTE performance phase possible presented problem processor prototype reference representation represented requirements rules selected sequence shown shows signal simulation single specification step structure task techniques theory transistor verification wafer
Bibliographic information
| Title | ESPRIT '88: Putting the Technology to Use : Proceedings of the 5th Annual ESPRIT Conference, Brussels, November 14-17, 1988, Part 1 Volume 5 of ESPRIT : annual conference : proceedings ESPRIT '88: Putting the Technology to Use : Proceedings of the 5th Annual ESPRIT Conference, Brussels, November 14-17, 1988, Commission of the European Communities. Directorate-General for Telecommunications, Information Industries, and Innovation Volume 11852 of EUR (Brussels), ISSN 0303-755X Volume 11852 of EUR (Series) Publication no. EUR 11852 of the Commission of the European Communities, Directorate-General Telecommunications, Information Industries, and Innovation, Luxembourg |
| Author | Commission of the European Communities. Directorate-General for Telecommunications, Information Industries, and Innovation |
| Publisher | North-Holland, 1988 |
| Original from | the University of California |
| Digitized | 6 Nov 2009 |
| ISBN | 0444871454, 9780444871459 |
| Length | 1759 pages |
| Export Citation | BiBTeX EndNote RefMan |