ESPRIT '88: Putting the Technology to Use : Proceedings of the 5th Annual ESPRIT Conference, Brussels, November 14-17, 1988, Part 1North-Holland, 1988 - 1759 pages Part1. Advanced microelectronics. VLSI technologies - comparisons and prospects. Software technology. Advanced information processing. Part2. Office systems.Computer integrated manufacturing. Information exchange system. |
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Page 46
... parameter ( gain , flatness of gain , stability , group delay , and all twoport parameters ) can be used to formulate a goal ( error function ) for the optimization . The user can define his own error function or may use an implemented ...
... parameter ( gain , flatness of gain , stability , group delay , and all twoport parameters ) can be used to formulate a goal ( error function ) for the optimization . The user can define his own error function or may use an implemented ...
Page 59
... parameters relative to the same device and the same ( approx- imately ) working point are shown in Fig.5 . Very good agreement is found for S11 and S21 . On the other hand , while a still good agreement is obtained for S22 , there is a ...
... parameters relative to the same device and the same ( approx- imately ) working point are shown in Fig.5 . Very good agreement is found for S11 and S21 . On the other hand , while a still good agreement is obtained for S22 , there is a ...
Page 64
... parameters of the MESFET , which can be derived from microwave measurements , are thus useful up to at least 10 GHz . Approximate expressions for the Y - parameters of the intrinsic transistors , for the maximum stable gain ( MSG ) ...
... parameters of the MESFET , which can be derived from microwave measurements , are thus useful up to at least 10 GHz . Approximate expressions for the Y - parameters of the intrinsic transistors , for the maximum stable gain ( MSG ) ...
Contents
A Technology Transfer from Research to Development Project | 3 |
BitRate Reduction of High Quality Audio Signals Using FloatingPoint | 13 |
Materials and Devices Toward ThreeDimensional Integration Project 245 | 22 |
Copyright | |
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Common terms and phrases
abstract algorithm allows analysis Aphrodite application approach architecture array basic behaviour BICMOS cell chip circuit CMOS communication complex components Computer concepts constraints database debugging defined demonstrator described devices distributed domain dynamic efficient environment error Esprit Project etching evaluation example execution expert systems Figure function GaAs gate GEODE global goal graphical IEEE implementation inference engine input integrated integrated circuits interaction interpreter kernel knowledge base knowledge representation layer LFSR logic programming machine mechanism memory MESFET method methodology module node object-oriented objects operations optimization output parallel parameters partial evaluation PCTE performance phase possible predicates problem Proc procedure processor Prolog Prolog III prototype query relations representation requirements rule semantic sequence signal simulation specific structure subcircuit SUPERNODE task techniques transistor transputer tuple UNIX VLSI wafer