ESPRIT '88: Putting the Technology to Use : Proceedings of the 5th Annual ESPRIT Conference, Brussels, November 14-17, 1988, Part 1North-Holland, 1988 - 1759 pages Part1. Advanced microelectronics. VLSI technologies - comparisons and prospects. Software technology. Advanced information processing. Part2. Office systems.Computer integrated manufacturing. Information exchange system. |
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Page 203
... pattern generator - ' Circular shift ' pattern generator sequences . for generating sliding pattern for HOLDing a constant pattern . The test registers can be used individually or connected together to form LFSRs , either to produce ...
... pattern generator - ' Circular shift ' pattern generator sequences . for generating sliding pattern for HOLDing a constant pattern . The test registers can be used individually or connected together to form LFSRs , either to produce ...
Page 204
... pattern ( P1 ) is given by : P12 - N So the probability of detecting the fault with M random patterns is given by : PM 1- ( 1-2 - N ) M It can be easily shown that in the range 1 < N < 17 , if M = N + 3 then : PM 99.9 % Therefore any ...
... pattern ( P1 ) is given by : P12 - N So the probability of detecting the fault with M random patterns is given by : PM 1- ( 1-2 - N ) M It can be easily shown that in the range 1 < N < 17 , if M = N + 3 then : PM 99.9 % Therefore any ...
Page 211
... patterns applied to produce a quasi- exhaustive pattern set . SLIDING to it . - a port , typically data , can have a sliding pattern sequence applied These patterns can be used in combination . For example , when testing an ALU a HOLD ...
... patterns applied to produce a quasi- exhaustive pattern set . SLIDING to it . - a port , typically data , can have a sliding pattern sequence applied These patterns can be used in combination . For example , when testing an ALU a HOLD ...
Contents
A Technology Transfer from Research to Development Project | 3 |
BitRate Reduction of High Quality Audio Signals Using FloatingPoint | 13 |
Materials and Devices Toward ThreeDimensional Integration Project 245 | 22 |
Copyright | |
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abstract algorithm allows analysis Aphrodite application approach architecture array basic behaviour BICMOS cell chip circuit CMOS communication complex components Computer concepts constraints database debugging defined demonstrator described devices distributed domain dynamic efficient environment error Esprit Project etching evaluation example execution expert systems Figure function GaAs gate GEODE global goal graphical IEEE implementation inference engine input integrated integrated circuits interaction interpreter kernel knowledge base knowledge representation layer LFSR logic programming machine mechanism memory MESFET method methodology module node object-oriented objects operations optimization output parallel parameters partial evaluation PCTE performance phase possible predicates problem Proc procedure processor Prolog Prolog III prototype query relations representation requirements rule semantic sequence signal simulation specific structure subcircuit SUPERNODE task techniques transistor transputer tuple UNIX VLSI wafer